Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-ray Microanalysis
نویسندگان
چکیده
منابع مشابه
Fundamental Constants for Quantitative X-ray Microanalysis.
Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618004385